MEP EP#377: Countdown to Hype
Component selection for your next product design is difficult as is with having to juggle temperature requirements, supply chain availability problems, and functionality parameters. Now consider your product in an environment that will actively destroy the semiconductors. This episode we dip our toes into Radiation exposure for electronics!
Topics:
Electronics and radiation
- Radiation Handbook for Electronics
- Silicon does strange things in the presence of radiation
- Failures -
- Two Flavors - non permanent or permanent
- SEE (single event error)
- SEU (single event upset)
- SEL (single-event latch-up)
- SEGR (single-event gate rupture)
- SEB (Single event burnout)
- PN junctions
- Fets
- CMOS - Memory
- Types of radiation exposure
- TID (total ionizing dose)
- Rate specific
- ELDRS (Enhanced low dose rate sensitivity)
- Proton
- Neutron
SpaceX starship
- Starship is the largest and most powerful launch vehicle ever flown and the first intended to be fully reusable
- Launch was great to watch
- Damage to launch pad
- Twice the thrust of the Saturn V
What kind of topics and discussions do Senior or Principal Engineers Care about?